Thermal Analysis and Measurement of Electron Devices Research |
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Thermal
Modeling and Measurement of AlGaN/GaN HFETs Built on Sapphire and SiC
Substrates
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Thermal model of a five layer structure with a heat source layout
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Physical structure of an AlGaN/GaN HFET device
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Thermal measurement set up with liquid crystal
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Calculated
and measured peak temperatures for device on sapphire
substrate
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Calculated and measured peak temperatures for device on SiC substrate
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